Joanne Bechta Dugan		Research Interests: Bayesian Belief Networks (BBN) Binary Decision Diagrams (BDD) Dependability Dependability Assessment Dependable computing Dynamic fault trees Fault tree analysis Markov Analysis Probabilistic Assessment Reliability engineering
	Professor and Director, Computer Engineering
	Email address:     j.b.dugan@ieee.org Home Page:      Phone:     (434) 982-2078 or (434)3198 Fax:     (434) 924-8818 Office:     Thornton Hall - E203

Summary:

Her research interests include hardware and software reliability engineering, fault tolerant computing, and mathematical modeling using dynamic fault trees, Markov models, Bayesian networks and simulation.

Background:

Joanne Bechta Dugan was awarded the B.A. degree in Mathematics and Computer Science from La Salle University, Philadelphia, PA in 1980, and the M.S. and PhD degrees in Electrical Engineering from Duke University, Durham, NC in 1982 and 1984, respectively. She has performed and directed research on the development and application of techniques for the analysis of computer systems which are designed to tolerate hardware and software faults. Dr. Dugan is an IEEE Fellow. She was Associate Editor of the IEEE Transactions on Reliability for 10 years, and is currently Associate Editor of the IEEE Transactions on Software Engineering. She served on the National Research Council Committee on Application of Digital Instrumentation and Control Systems to Nuclear Power Plant Operations and Safety. She is also a member of Eta Kappa Nu, and Phi Beta Kappa. Previously, she taught at Duke University and worked as a visiting scientist at the Research Triangle Institute.

Research:

• System Safety Assessment using Binary Decision Diagrams (NASA Goddard Space Flight Center)
• Dynamic Fault Tree Analysis/ Galileo software tool (NASA Langley Research Center) (joint work with Kevin Sullivan)
• Dynamic Fault Tree Analysis in support of RTSAD (Risk Tool For Advanced Design) (NASA JPL)

Most Recent Publications:

• Yong Ou and Joanne Bechta Dugan, "Approximate Sensitivity Analysis for Acyclic Markov Reliability Models," IEEE Transactions on Reliability, June 2003, pages 220-230.
• Ed Stoker and Joanne Bechta Dugan, “When Does it Pay to Make More Reliable Software Systems?," Proceedings of the International Symposium on Software Reliability Engineering (ISSRE), November 2003.
• Susan Donohue and Joanne Bechta Dugan, "Modeling the "Good enough to release" decision using preference structures and Bayesian belief networks," Reliability and Maintainability Symposium, January 2003.
• Tariq Assaf and Joanne Bechta Dugan, "Automatic generation of diagnostic expert systems from fault trees," Reliability and Maintainability Symposium, January 2003.
• Ed Stoker and Joanne Bechta Dugan, "Economic Reliability Forecasting in an Uncertain World," 17th European Simulation MultiConference [ESM], June 2003.

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