More Images From the SDMRG:
Microcontact Printing (uCP) Patterns, Molds and Stamps.
TEM images of SIS Trilayer material.
Nano-scale patterns defined in PMMA using E-Beam lithography
Ultra-thin Silicon Chips.
SEM image of a Lange Coupler.
SEM image of a via above an SIS junction.
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Last Updated May 10th, 2003 For comments or questions, contact jcs4x@virginia.edu
