A Collection of Images of HEBs Fabriacted using a Focused Ion Beam (FIB):

Early work at UVa on THz HEB mixers was focused on fabrication methods using FIB. This incorporated mostly substractive processes, in which small quantites of material are carved from the HEB contact pads, forming the nanoscale HEB microbridge.


A completed HEB fabricated using the Focused Ion Beam.

Resistive transistion of a HEB fabricated using the Focused Ion Beam.

SEM image taken after the first FIB milling process.

Dimensions after the first FIB milling process.

Close-up view of the bowtie kernel.

SEM image taken after the second FIB milling process.

Dimensions after the second FIB milling process.

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Last Updated May 8th, 2003
For comments or questions, contact jcs4x@virginia.edu